International Design and Test Symposium
IDT 2017
Kuwait, December 17-19, 2017
 
   
    Covered Topics        

   

Topics include, but are not limited to, the following:

 

Design Methods and Tools:

  • IP and SOC Design
  • Multiprocessor/Multi-core Systems
  • Embedded Systems
  • DFX
  • Analog, Mixed Signal and RF Design
  • High Speed Circuits Design
  • Design of MEMS and MOEMS
  • Low Voltage and Low Power systems
  • Innovative Technologies
  • Real Time Systems
  • Simulation, Validation & Verification
  • System Specification and Modeling
  • Formal Methods and Verification
  • System Design/Synthesis/Optimization
Test and Reliability:  
  • Automotive Reliability & Test
  • IP and SOC Testing
  • Multiprocessor/Multi-Core Systems Test
  • Memory & FPGA Test & Repair
  • Internet of Things Test
  • High Speed, Analog, Mixed Signal & RF Testing
  • MEMS/MOEMS Testing
  • Defect and Fault Modeling
  • DFT, BIST and BISR
  • On-line Testing / Fault Tolerance
  • Fault Simulation, ATPG
  • Reliability Failures/ Modeling
  • Circuit Reliability
  • Electronic System Reliability